ONG, K.; SAID, M. R. A Study on the Deposition of Tin on the Contac ts Subjected to High Frequency Impac t Loading in Semiconductor Device Testing. Journal of Mechanical Engineering and Technology (JMET), [S. l.], v. 3, n. 1, 2015. Disponível em: https://jmet.utem.edu.my/jmet/article/view/350. Acesso em: 16 sep. 2025.